MipoxProbe Card Cleaning Film

NWE Type

The unique feature of the NWE type is its denser polishing layer, achieved through smaller foam pores compared to the existing SWE type. This characteristic makes it particularly suitable for narrow pin pitch probe cards. As semiconductor devices continue to shrink in size, probe card pin pitches are also becoming narrower. The NWE type is designed specifically to address the needs of narrow pin pitch probe cards.

Description

Key Features

Physical Properties
Thickness590µm (Excluding backing release film)​
Abrasive MaterialAluminum oxide​
Abrasive Size2.0µm​
Heat-resistance120°C​

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